We offer best-suited test services for customers ranging from test program development to mass production yield improvement and test time optimization. Testing-only orders are also dealt with.
| Product | Open/Short | Loose FT | Special FT | Program conversion |
|---|---|---|---|---|
| RAM(DRAM,PSRAM,SRAM) | ○ | ○ | ○ | ○ |
| FLASH(NOR,NAND) | ○ | ○ | ○ | ○ |
| DRAM+FLASH(MCP) | #1 | ○ | ○ | ○ |
| LOGIC(CPU,BB) | ○ | #2 | #3 | #3 |
| LOGIC+ANALOG(SiP) | ○ | #3 | #3 | #3 |
| ANALOG(power IC) | ○ | #3 | #3 | #3 |
| RF | ○ | #3 | #3 | #3 |
| LOGIC+Memory(SiP) | #1 | #2 | #3 | #3 |
#1:Internal connection as MCP
#2:Offer the test pattern by customer
#3:Order to out source
| - | Frequency(Data rate) | Products | PKG |
|---|---|---|---|
| Memory | 533M/1.066G | 2G/1G/512M DDR2/DDR3(High -speed) | FBGA |
| 400M/800M | 1G/512M DDR2 /DDR/SDR,SRAMFLASH(Middle speed) | FBGA | |
| 250M500M | 1G/512M DDR2/DDR/SDR,SRAMFLASH(low speed) | FBGA | |
| 250MHz | 512M/256M DDR2/DDR/SDR, FLASH(low speed) | FBGA | |
| 70MHz | FLASH,1G/512M DDR2/DDR | FBGA | |
| Logic etc. | 40MHz | controller,sensor,etc | QFP/BGA/QFN |
| 20MHz | controller,sensor,etc | QFP/BGA/QFN |
